DETERMINATION OF ALUMINUM BY ATOMIC-ABSORPTION SPECTROMETRY AND X-RAY-DIFFRACTION IN GA1-XALXAS EPITAXIAL LAYERS GROWN BY MOLECULAR-BEAM EPITAXY

被引：10

作者：

BAUDET, M

REGRENY, O

DUPAS, G

AUVRAY, P

GAUNEAU, M

REGRENY, A

TALALAEFF, G

机构：

来源：

MATERIALS RESEARCH BULLETIN | 1983年 / 18卷 / 02期

关键词：

D O I：

10.1016/0025-5408(83)90072-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：123 / 133

页数：11

共 26 条

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