POINT-DEFECTS AND DEFECT IMPURITY INTERACTION IN CDXHG1-XTE AND OTHER II-VI SEMICONDUCTORS - FACTS AND CONJECTURES

被引:16
作者
MARFAING, Y
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 04期
关键词
D O I
10.1116/1.586269
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several aspects concerning the role of point defects and defect-impurity interaction in II-VI semiconductors are reviewed. First, the properties of the cation vacancy in CdxHg1-xTe are re-examined in the light of two experiments (mass-loss measurements, positron lifetime) which point out to a large concentration of vacancy-type defects compared to the hole carrier density. The possibility for the cation vacancy to be a negative-U center and the formation of divacancies are discussed. Second, the case of donor-vacancy pairs is considered. A model of impurity compensation is given which accounts for the doping limits observed in a number of semiconductors in terms of a fundamental energy parameter (dangling bond energy).
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页码:1444 / 1450
页数:7
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