SURFACE AND TRACE ANALYSIS BY HIGH-RESOLUTION TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY

被引：28

作者：

NIEHUIS, E

HELLER, T

JURGENS, U

BENNINGHOVEN, A

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期

关键词：

D O I：

10.1116/1.576009

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1823 / 1828

页数：6

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