2-WAVELENGTH SPECKLE INTERFEROMETRIC-TECHNIQUE FOR ROUGH-SURFACE CONTOUR MEASUREMENT

[1] [Anonymous], 1983, HOLOGRAPHIC SPECKLE

[2] 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1984, 23 (24) : 4539 - 4543

[3] CRANE R, 1969, APPL OPTICS, V8, P538

[4] Fercher A. F., 1983, Laser und Optoelektronik, V15, P301

[5] ROUGH-SURFACE INTERFEROMETRY WITH A 2-WAVELENGTH HETERODYNE SPECKLE INTERFEROMETER [J]. APPLIED OPTICS, 1985, 24 (14) : 2181 - 2188

[6] FERCHER AF, 1984, 6TH INT C LAS 83, P142

[7] Goodman JW, 1984, LASER SPECKLE RELATE, P9

[8] GOODMAN JW, 1963, TR23031 STANF U STAN

[9] MIDDLETON D, 1960, INTRO STATISTICAL CO

[10] 2-WAVELENGTH INTERFEROMETRY [J]. APPLIED OPTICS, 1973, 12 (09): : 2071 - 2074

[1] [Anonymous], 1983, HOLOGRAPHIC SPECKLE

[2] 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1984, 23 (24) : 4539 - 4543

[3] CRANE R, 1969, APPL OPTICS, V8, P538

[4] Fercher A. F., 1983, Laser und Optoelektronik, V15, P301

[5] ROUGH-SURFACE INTERFEROMETRY WITH A 2-WAVELENGTH HETERODYNE SPECKLE INTERFEROMETER [J]. APPLIED OPTICS, 1985, 24 (14) : 2181 - 2188

[6] FERCHER AF, 1984, 6TH INT C LAS 83, P142

[7] Goodman JW, 1984, LASER SPECKLE RELATE, P9

[8] GOODMAN JW, 1963, TR23031 STANF U STAN

[9] MIDDLETON D, 1960, INTRO STATISTICAL CO

[10] 2-WAVELENGTH INTERFEROMETRY [J]. APPLIED OPTICS, 1973, 12 (09): : 2071 - 2074