MEASUREMENT OF CROSS-SECTIONS AND OSCILLATOR-STRENGTHS FOR XE BY ELECTRON-IMPACT

被引：48

作者：

SUZUKI, TY ^{[1
]}

SAKAI, Y ^{[1
]}

MIN, BS ^{[1
]}

TAKAYANAGI, T ^{[1
]}

WAKIYA, K ^{[1
]}

SUZUKI, H ^{[1
]}

INABA, T ^{[1
]}

TAKUMA, H ^{[1
]}

机构：

[1] UNIV ELECTROCOMMUN, INST LASER SCI, CHOFU, TOKYO 182, JAPAN

来源：

PHYSICAL REVIEW A | 1991年 / 43卷 / 11期

关键词：

D O I：

10.1103/PhysRevA.43.5867

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Differential cross sections and generalized oscillator strengths have been measured for two optically allowed transitions 5p6(1S0)-->5p5(2P1/2)6s and 5p5(2P3/2)6s in Xe by means of electron-energy-loss spectroscopy. These measurements are carried out for electron kinetic energies of 100, 400, and 500 eV at small scattering angles (theta = 1.4-degrees-14.6-degrees). The generalized oscillator strengths are extrapolated to zero momentum transfer to get the optical oscillator strengths and they are compared with those obtained by optical methods and theoretical calculations. The optical oscillator strengths obtained by this work for the 5p5(2P1/2)6s and 5p5(2P3/2)6s states are 0.158 +/- 0.019 and 0.222 +/- 0.027, respectively. Integral cross sections have been also determined for each impact energy. The errors are estimated to be less than 12%.

引用

页码：5867 / 5873

页数：7

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