SCANNING ION-CONDUCTANCE MICROSCOPE AND ATOMIC FORCE MICROSCOPE

被引:4
作者
PRATER, CB
DRAKE, B
GOULD, SAC
HANSMA, HG
HANSMA, PK
机构
[1] Department of Physics, University of California, Santa Barbara, California
关键词
D O I
10.1002/sca.4950120109
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
[No abstract available]
引用
收藏
页码:50 / 52
页数:3
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