STRUCTURAL-PROPERTIES OF PBTE FILMS STUDIED BY X-RAY ASYMMETRIC REFLECTIONS

被引:3
作者
BALESTRINO, G
LAGOMARSINO, S
SMYNTYNA, V
TUCCIARONE, A
机构
关键词
D O I
10.1016/0022-0248(82)90148-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
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页码:611 / 616
页数:6
相关论文
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[Anonymous], 1961, XRAY METALLOGRAPHY
[2]   APPLICATION OF ASYMMETRIC REFLECTIONS TO THE X-RAY STUDY OF STRUCTURAL DEFORMATION OF SURFACES [J].
BALESTRINO, G ;
LAGOMARSINO, S ;
MASTROGIACOMO, L ;
SCARINCI, F ;
TUCCIARONE, A .
THIN SOLID FILMS, 1981, 78 (04) :327-334
[3]  
BALESTRINO G, 1978, ACTA CRYST A, V34, pS207
[4]  
Francombe M. H., 1969, PHYS THIN FILMS, V5, P143
[5]  
Guinier A, 1952, XRAY CRYSTALLOGRAPHI
[6]  
KLUG HP, 1954, XRAY DIFFRACTION PRO