ESCA DEVICE AS SOFT-X-RAY SPECTROMETER

被引：2

作者：

EBEL, MF ^{[1
]}

GURKER, N ^{[1
]}

HASLAUER, N ^{[1
]}

机构：

[1] TECH UNIV WIEN, INST TECH PHYS, Vienna, AUSTRIA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1976年 / 9卷 / 06期

关键词：

D O I：

10.1016/0368-2048(76)80062-X

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：441 / 447

页数：7

相关论文

共 5 条

[1] X-RAY WAVELENGTHS
BEARDEN, JA
[J]. REVIEWS OF MODERN PHYSICS, 1967, 39 (01) : 78 - &
[2] ABSOLUTE CALIBRATION OF AN X-RAY PHOTOELECTRON SPECTROMETER
EBEL, MF
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (03) : 213 - 224
[3] GURKER N, 1975, MIKROCHIM ACTA S, V6, P431
[4] LII AND LIII EMISSION SPECTRA OF COPPER COMPOUNDS
RIBBLE, TJ
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 6 (02): : 473 - &
[5] ABSOLUTE DETERMINATION OF WORK FUNCTION OF PALLADIUM WITH X-RAY PHOTOELECTRON SPECTROMETER
SCHULTES, KAG
EBEL, MF
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (06) : 449 - 458