MEASUREMENT - AES AND XPS

被引：47

作者：

SEAH, MP

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期

关键词：

D O I：

10.1116/1.573062

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：1330 / 1337

页数：8

相关论文

共 53 条

[1] [Anonymous], 1978, ASTM SPECIAL TECHNIC
[2] XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .1. AN ABSOLUTE, TRACEABLE ENERGY CALIBRATION AND THE PROVISION OF ATOMIC REFERENCE LINE ENERGIES
ANTHONY, MT
SEAH, MP
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) : 95 - 106
[3] XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .2. RESULTS OF AN INTERLABORATORY COMPARISON
ANTHONY, MT
SEAH, MP
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) : 107 - 115
[4] PRECISELY CONSISTENT ENERGY CALIBRATION METHOD FOR X-RAY PHOTOELECTRON-SPECTROSCOPY
ASAMI, K
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (06) : 469 - 478
[5] RESULTS OF A TA2O5 SPUTTER YIELD ROUND ROBIN
BEVOLO, AJ
[J]. SURFACE AND INTERFACE ANALYSIS, 1981, 3 (06) : 240 - 242
[6] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION
BISHOP, HE
RIVIERE, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &
[7] Blattner R. J., 1979, Surface and Interface Analysis, V1, P32, DOI 10.1002/sia.740010107
[8] Bondi H., 1961, COSMOLOGY, V2nd
[9] BRIGGS D, 1983, PRACTICAL SURFACE AN
[10] NI/CR INTERFACE WIDTH DEPENDENCE ON SPUTTERED DEPTH
DAVARYA, F
ROUSH, ML
FINE, J
ANDREADIS, TD
GOKTEPE, OF
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 467 - 470

← 1 2 3 4 5 6 →