DETERMINING REFRACTIVE-INDEX AND THICKNESS OF THIN-FILMS FROM WAVELENGTH MEASUREMENTS ONLY

被引：121

作者：

SWANEPOEL, R

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1985年 / 2卷 / 08期

关键词：

D O I：

10.1364/JOSAA.2.001339

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1339 / 1343

页数：5

共 9 条

[1]

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[2]

CRAWFORD FS, 1968, WAVES, P182

[3]

Fowles G. R., 1975, INTRO MODERN OPTICS, P44

[4]

HEAVENS OS, 1964, PHYS THIN FILMS, V2, P193

[5]

KOLTUN MM, 1981, SELECTIVE OPTICAL SU, P9

MANIFACIER, JC ;

GASIOT, J ;

FILLARD, JP .

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[7]

Nussbaum A., 1976, CONT OPTICS SCI ENG, P168

SWANEPOEL, R .

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SWANEPOEL, R .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1984, 17 (10) :896-903