MULTIELEMENT TRACE ANALYSIS OF ROCKS AND SOILS BY EDXRF USING POLARIZED RADIATION

被引：22

作者：

HECKEL, J ^{[1
]}

BRUMME, M ^{[1
]}

WEINERT, A ^{[1
]}

IRMER, K ^{[1
]}

机构：

[1] DRESDEN UNIV TECHNOL,DEPT PHYS,SUBDEPT APPL NUCL PHYS,O-8010 DRESDEN,GERMANY

来源：

X-RAY SPECTROMETRY | 1991年 / 20卷 / 06期

关键词：

D O I：

10.1002/xrs.1300200608

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

An XRF device using polarized x-rays for trace element analysis of rocks and soils has been developed. During a measuring time of 1000 s (two single measurements of 750 and 250 s, respectively), 36 elements with atomic numbers 22 less-than-or-equal-to Z less-than-or-equal-to 92 and detection limits between 15 and 0.3 ppm can be determined with high precision. The ratio between the net counts from a characteristic line of the element being determined and the number of background counts caused mainly by Compton scattering is used for the matrix correction procedure. Absorption and enhancement effects by major sample element concentrations are taken into account. Good agreement was found between analytical results and certified values for standard reference materials.

引用

页码：287 / 292

页数：6

共 11 条

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