USE OF THE 447 NM HE-I LINE TO DETERMINE ELECTRON CONCENTRATIONS

被引：35

作者：

CZERNICHOWSKI, A

CHAPELLE, J

机构：

来源：

JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER | 1985年 / 33卷 / 05期

关键词：

D O I：

10.1016/0022-4073(85)90129-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：427 / 436

页数：10

共 33 条

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[6] APPLICATION OF MODEL MICROFIELD METHOD TO STARK PROFILES OF OVERLAPPING AND ISOLATED NEUTRAL LINES [J].

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[10]

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