SURFACE SECONDARY-ELECTRON AND SECONDARY-ION EMISSION INDUCED BY LARGE MOLECULAR ION IMPACTS

被引：47

作者：

BRUNELLE, A

CHAURAND, P

DELLANEGRA, S

LEBEYEC, Y

BAPTISTA, GB

机构：

[1] INST PHYS NUCL LYON,CNRS,IN2P3,F-91406 ORSAY,FRANCE

[2] PUC,DEPT FIS,BR-22453 RIO JANEIRO,BRAZIL

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1993年 / 126卷

关键词：

SECONDARY ION EMISSION; SECONDARY ELECTRON EMISSION; PLASMA DESORPTION MASS SPECTROMETRY;

D O I：

10.1016/0168-1176(93)80071-L

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

This paper presents results on secondary ion and secondary electron yields under impacts of large ions at 18 keV and with 100 < m/z < 70 000 on a CsI-coated surface. Ratios of secondary electron emission to secondary ion emission have been measured and it is shown that the negative secondary ion yield is much larger than the electron yield. Electrons are still emitted below an energy of impact per mass unit of 1 eV Da-1 (10(6) CM s-1). Effects of grids in the acceleration of secondary ions and secondary electrons are important.

引用

页码：65 / 73

页数：9

共 21 条

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