SELF-TESTING CMOS OPERATIONAL-AMPLIFIER

被引：11

作者：

ROCA, M ^{[1
]}

RUBIO, A ^{[1
]}

机构：

[1] UNIV POLITECN CATALUNYA,ETSETB,DEPT ELECTR ENGN,C JORDI GIRONA SALGADO S-N,E-08034 BARCELONA,SPAIN

来源：

ELECTRONICS LETTERS | 1992年 / 28卷 / 15期

关键词：

OPERATIONAL AMPLIFIERS; BUILT-IN SELF-TEST;

D O I：

10.1049/el:19920924

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and I(DD) current effects caused by these types of failure in the circuits are presented. A current sensing circuit oriented to BIST, based on current mirrors is also developed. From these results, a selftesting operational amplifier circuit is proposed.

引用

页码：1452 / 1454

页数：3