SUPPLY CURRENT TESTING OF MIXED ANALOG AND DIGITAL ICS

被引：29

作者：

BELL, IM

CAMPLIN, DA

TAYLOR, GE

BANNISTER, BR

机构：

[1] VLSI Design & Test Group, Department of Electronic Engineering

来源：

ELECTRONICS LETTERS | 1991年 / 27卷 / 17期

关键词：

INTEGRATED CIRCUITS; MEASUREMENT;

D O I：

10.1049/el:19910990

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A proposed extension of the technique of supply current monitoring to the testing of analogue circuit modules with the intention of developing a unified testing approach for mixed ASICs. Simulation results are reported to illustrate the effectiveness of the method.

引用

页码：1581 / 1583

页数：3