THE EFFECTS OF MICROSTRUCTURE ON INTERFACE CHARACTERIZATION

被引：31

作者：

LUDEKE, R

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(86)90859-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：290 / 300

页数：11

共 26 条

[1] BRILLSON LJ, 1979, J VAC SCI TECHNOL, V16, P1137, DOI 10.1116/1.570177
[2] FERMI-LEVEL PINNING AND CHEMICAL-STRUCTURE OF INP-METAL INTERFACES
BRILLSON, LJ
BRUCKER, CF
KATNANI, AD
STOFFEL, NG
DANIELS, R
MARGARITONDO, G
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02): : 564 - 569
[3] CAMPAGNA M, 1977, PHOTOEMISSION SOLIDS, V2, pCH4
[4] CARDONA M, 1977, PHOTOEMISSION SOLIDS, V2
[5] CARDONA M, 1977, PHOTOEMISSION SOLIDS, V1
[6] MANY-ELECTRON SINGULARITY IN X-RAY PHOTOEMISSION AND X-RAY LINE SPECTRA FROM METALS
DONIACH, S
SUNJIC, M
[J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (02): : 285 - &
[7] AN ELLIPSOIDAL MIRROR DISPLAY ANALYZER SYSTEM FOR ELECTRON-ENERGY AND ANGULAR MEASUREMENTS
EASTMAN, DE
DONELON, JJ
HIEN, NC
HIMPSEL, FJ
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 172 (1-2): : 327 - 336
[8] EASTMAN DE, 1980, PHYS REV LETT, V45, P675
[9] HUFNER S, 1977, PHOTOEMISSION SOLIDS, V2, pCH3
[10] FERMI ENERGY PINNING BEHAVIOR AND CHEMICAL-REACTIVITY OF THE PD/GAAS (110) INTERFACE
KENDELEWICZ, T
PETRO, WG
PAN, SH
WILLIAMS, MD
LINDAU, I
SPICER, WE
[J]. APPLIED PHYSICS LETTERS, 1984, 44 (01) : 113 - 115