STRUCTURE OF ELECTRODEPOSITED COPPER EXAMINED BY X-RAY DIFFRACTION TECHNIQUES

被引:46
作者
HOFER, EM
HINTERMANN, HE
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D O I
10.1149/1.2423487
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O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:167 / +
页数:1
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共 38 条
[21]  
MILLS B, 1877, P ROY SOC LONDON, V26, P504
[22]  
PALATNIK LG, 1940, J TECH PHYS USSR, V10, P1756
[23]   X-RAY DIFFRACTION BY FACE-CENTERED CUBIC CRYSTALS WITH DEFORMATION FAULTS [J].
PATERSON, MS .
JOURNAL OF APPLIED PHYSICS, 1952, 23 (08) :805-811
[24]   ON THE GROWTH AND PROPERTIES OF ELECTROLYTIC WHISKERS [J].
PRICE, PB ;
VERMILYEA, DA ;
WEBB, MB .
ACTA METALLURGICA, 1958, 6 (08) :524-531
[26]  
SEEGER A, 1955, HANDBUCH PHYSIK, V7
[27]  
SEITER H, 1959, Z ELEKTROCHEM, V63, P249
[28]  
STEINEMANN S, 1958, B SOC SUISSE CHRONOM, V4, P230
[29]  
STEINEMANN S, 1960, SCHWEIZ ARCH ANGEW W, V26, P202
[30]   A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].
STOKES, AR .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346) :382-391