COMPOSITION STUDY OF PHOTOCHEMICALLY GROWN OXIDES OF HG1-XCDXTE

被引：13

作者：

DAVIS, GD

BUCHNER, SP

BYER, NE

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.571974

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：670 / 671

页数：2

共 6 条

[1] PHOTOCHEMICAL OXIDATION OF (HG,CD)TE [J].

BUCHNER, SP ;

DAVIS, GD ;

BYER, NE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02) :446-447

[2] ANODIC OXIDE COMPOSITION AND HG DEPLETION AT THE OXIDE-SEMICONDUCTOR INTERFACE OF HG1-XCDXTE [J].

DAVIS, GD ;

SUN, TS ;

BUCHNER, SP ;

BYER, NE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :472-476

[3] APPLICATION OF SURFACE BEHAVIOR DIAGRAMS TO THE STUDY OF HYDRATION OF PHOSPHORIC-ACID ANODIZED ALUMINUM [J].

DAVIS, GD ;

SUN, TS ;

AHEARN, JS ;

VENABLES, JD .

JOURNAL OF MATERIALS SCIENCE, 1982, 17 (06) :1807-1818

[4]

DAVIS GD, UNPUB APPL SURF SCI

[5] THE COMPOSITION OF ANODIC OXIDE-FILMS ON HG0.8CD0.2TE [J].

FARROW, RFC ;

DENNIS, PNJ ;

BISHOP, HE ;

SMART, NR ;

WOTHERSPOON, JTM .

THIN SOLID FILMS, 1982, 88 (01) :87-92

[6]

Wagner C.D, 1978, HDB XRAY PHOTOELECTR

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