TOWARDS A UNIVERSAL CURVE FOR ELECTRON ATTENUATION - ELASTIC-SCATTERING DATA FOR 45 ELEMENTS

被引:88
作者
WERNER, WSM
机构
[1] Institut für Allgemeine Physik, Technical University Vienna, Vienna, A 1040
关键词
D O I
10.1002/sia.740180307
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The attenuation parameter (AP), which quantitatively describes the influence of elastic electron scattering on the electron spectroscopies, has been calculated for 45 elements (Be, C, Mg, Al, Si, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Sr, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb, Te, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au, Pb) and for energies of 250, 500, 1000 and 1500 eV. The calculations were performed with a Monte Carlo algorithm in which elastic scattering is modelled by use of the partial wave expansion method. The results show a linear relationship between the AP and the inelastic mean free path (IMFP), and a linear least-squares fit of the data provides a simple formula to calculate the AP for a given material and energy. The depth distribution function (DDF), which in the most general sense describes the attenuation properties of signal electrons, can be calculated analytically using this AP. The possibility of using the calculated AP values in combination with this DDF to extract IMFP data from an overlayer experiment has also been explored. Evidence is found, and discussed, that the presented algorithm can be used to convert IMFPs to attenuation lengths (AL).
引用
收藏
页码:217 / 228
页数:12
相关论文
共 39 条
[1]  
ASHLEY JC, 1982, SURF INTERFACE ANAL, V4, P2
[2]   NEW TECHNIQUE FOR INVESTIGATION OF ANGULAR-DISTRIBUTION OF PHOTOEMISSION FROM SOLIDS - DEMONSTRATION OF THE EFFECT OF ELASTIC-SCATTERING [J].
BASCHENKO, OA ;
MACHAVARIANI, GV ;
NEFEDOV, VI .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1984, 34 (03) :305-308
[3]   RELATIVE INTENSITIES IN X-RAY PHOTO-ELECTRON SPECTRA .9. ESTIMATES FOR PHOTO-ELECTRON MEAN FREE PATHS TAKING INTO ACCOUNT ELASTIC COLLISIONS IN A SOLID [J].
BASCHENKO, OA ;
NEFEDOV, VI .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 27 (02) :109-118
[5]   RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .4. EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE FREE-PATH OF ELECTRONS AND THEIR ANGULAR-DISTRIBUTION [J].
BASCHENKO, OA ;
NEFEDOV, VI .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 17 (06) :405-420
[6]   ANALYTICAL EXPRESSIONS FOR POTENTIALS OF NEUTRAL THOMAS-FERMI-DIRAC ATOMS AND FOR CORRESPONDING ATOMIC SCATTERING FACTORS FOR X RAYS AND ELECTRONS [J].
BONHAM, RA ;
STRAND, TG .
JOURNAL OF CHEMICAL PHYSICS, 1963, 39 (09) :2200-&
[7]   ON THE INFLUENCE OF ELASTIC-SCATTERING ON ASYMMETRIC XP-SIGNAL DISTRIBUTION [J].
EBEL, H ;
EBEL, MF ;
JABLONSKI, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1985, 35 (1-2) :155-164
[8]  
EBEL H, 1984, J ELECTRON SPECTROSC, V24, P355
[9]  
EBEL H, 1984, SURF INTERFACE ANAL, V6, P14
[10]   ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS .
PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) :275-388