STRUCTURE-ANALYSIS OF SI(100)2XN SURFACES BY ION CHANNELING AND BLOCKING SPECTROSCOPY

被引：1

作者：

ICHINOKAWA, T

YOKOYAMA, Y

FUKUNAGA, K

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 33卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(88)90642-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：611 / 614

页数：4

共 18 条

[1] ORDERED-DEFECT MODEL FOR SI(001)-(2X8) [J].

ARUGA, T ;

MURATA, Y .

PHYSICAL REVIEW B, 1986, 34 (08) :5654-5657

[2]

BUCH TM, 1977, INELASTIC ION SURFAC, P47

[3] ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES [J].

CHADI, DJ .

PHYSICAL REVIEW LETTERS, 1979, 43 (01) :43-47

[4]

GRAFF K, 1982, AGGREGATION PHENOMEN, P121

[5] NEUTRALIZATION OF ENERGETIC HE IONS SCATTERED FROM CLEAN 2 X 1 SI (100) [J].

HAIGHT, R ;

FELDMAN, LC ;

BUCK, TM ;

GIBSON, WM .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) :501-504

[6] SI(100)2XN STRUCTURES INDUCED BY NI CONTAMINATION [J].

KATO, K ;

IDE, T ;

MIURA, S ;

TAMURA, A ;

ICHINOKAWA, T .

SURFACE SCIENCE, 1988, 194 (1-2) :L87-L94

[7] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J].

LANDER, JJ ;

MORRISON, J .

JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) :729-&

[8]

MARTIN JA, 1985, PHYS REV LETT, V56, P1936

[9]

MULLER K, 1984, DETERMINATION SURFAC, P483

[10] DIMER-PLUS-CHAIN STRUCTURE FOR THE SI(100)-C(4X2) SURFACE [J].

NORTHRUP, JE .

PHYSICAL REVIEW LETTERS, 1985, 54 (08) :815-818

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