MEASUREMENT OF NONPLANAR DIELECTRIC SAMPLES USING AN OPEN RESONATOR

被引：15

作者：

CHAN, WFP

CHAMBERS, B

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1987年 / 35卷 / 12期

关键词：

D O I：

10.1109/TMTT.1987.1133871

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

引用

页码：1429 / 1434

页数：6

共 9 条

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MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR .2. EXPERIMENTAL [J].

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