MODELING OF SINGLE-EVENT UPSET IN BIPOLAR INTEGRATED-CIRCUITS

被引：14

作者：

ZOUTENDYK, JA

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333167

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4540 / 4545

页数：6

共 11 条

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