MODELING OF SINGLE-EVENT UPSET IN BIPOLAR INTEGRATED-CIRCUITS

被引:14
作者
ZOUTENDYK, JA
机构
关键词
D O I
10.1109/TNS.1983.4333167
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:4540 / 4545
页数:6
相关论文
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