SINGLE EVENT UPSET VULNERABILITY OF SELECTED 4K AND 16K CMOS STATIC RAMS

被引：11

作者：

KOLASINSKI, WA

KOGA, R

BLAKE, JB

BRUCKER, G

PANDYA, P

PETERSEN, E

PRICE, W

机构：

[1] HUGHES AIRCRAFT CO,NEWPORT BEACH,CA 92663

[2] RCA CORP,PRINCETON,NJ 08540

[3] USN,RES LAB,WASHINGTON,DC 20375

[4] CALTECH,JET PROP LAB,PASADENA,CA 91103

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期

关键词：

D O I：

10.1109/TNS.1982.4336493

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2044 / 2048

页数：5

共 13 条

[1]

ANDREWS JL, 1982, IEEE T NUCLEAR SCI, V29

[2]

BINDER D, 1975, IEEE T NUCLEAR SCI, V22, P2575

[3] SIMULATION OF COSMIC RAY-INDUCED SOFT ERRORS IN CMOS-SOS MEMORIES [J].

BRUCKER, GJ ;

CHATER, W ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1490-1493

[4]

DIEHL SE, 1982, IEEE T NUCLEAR SCI, V29

[5]

GUPTA A, 1981, DEC INT EL DEV M WAS

[6]

HEAGERTY WF, COMMUNICATION

[7] SIMULATION OF COSMIC-RAY INDUCED SOFT ERRORS AND LATCHUP IN INTEGRATED-CIRCUIT COMPUTER MEMORIES [J].

KOLASINSKI, WA ;

BLAKE, JB ;

ANTHONY, JK ;

PRICE, WE ;

SMITH, EC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5087-5091

[8]

PETERSEN E, 1982, IEEE T NUCLEAR SCI, V29

[9] COSMIC-RAY-INDUCED ERRORS IN MOS DEVICES [J].

PICKEL, JC ;

BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (02) :1006-1015

[10]

PICKEL JC, 1982, IEEE T NUCLEAR SCI, V29

← 1 2 →