PROFILE STRUCTURES OF VERY THIN MULTILAYERS BY X-RAY-DIFFRACTION USING DIRECT AND REFINEMENT METHODS OF ANALYSIS

被引：64

作者：

SKITA, V

FILIPKOWSKI, M

GARITO, AF

机构：

[1] UNIV PENN,RES STRUCT MATTER LAB,PHILADELPHIA,PA 19104

[2] UNIV PENN,DEPT BIOCHEM & BIOPHYS,PHILADELPHIA,PA 19104

[3] UNIV PENN,DEPT PHYS,PHILADELPHIA,PA 19104

[4] UNIV PENN,DEPT CHEM,PHILADELPHIA,PA 19104

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.34.5826

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5826 / 5837

页数：12

共 14 条

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[3] Hoseman R, 1962, DIRECT ANAL DIFFRACT
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[7] THE USE OF CONTINUOUS DIFFRACTION DATA AS A PHASE CONSTRAINT .1. ONE-DIMENSIONAL THEORY
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1981, 14 (JUN): : 160 - 168
[8] LIPID BILAYER ULTRASTRUCTURE - ELECTRON-DENSITY PROFILES AND CHAIN TILT ANGLES AS DETERMINED BY X-RAY-DIFFRACTION
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[J]. BIOCHIMICA ET BIOPHYSICA ACTA, 1976, 448 (01) : 15 - 33
[9] SLOW SCAN SIT DETECTOR FOR X-RAY-DIFFRACTION STUDIES USING SYNCHROTRON RADIATION
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (01) : 338 - 345
[10] HIGH-RESOLUTION X-RAY-DIFFRACTION FROM SMALL NUMBERS OF LANGMUIR-BLODGETT LAYERS OF MANGANESE STEARATE
POMERANTZ, M
SEGMULLER, A
[J]. THIN SOLID FILMS, 1980, 68 (01) : 33 - 45

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