LOW-TEMPERATURE SCALING FOR SYSTEMS WITH RANDOM-FIELDS AND ANISOTROPIES

被引：161

作者：

AHARONY, A ^{[1
]}

PYTTE, E ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1983年 / 27卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.27.5872

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5872 / 5874

页数：3

共 33 条

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