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SOME ILLUMINATION ON THE MECHANISM OF SIO2 ETCHING IN HF SOLUTIONS
被引:42
作者
:
NIELSEN, H
论文数:
0
引用数:
0
h-index:
0
NIELSEN, H
HACKLEMAN, D
论文数:
0
引用数:
0
h-index:
0
HACKLEMAN, D
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1983年
/ 130卷
/ 03期
关键词
:
D O I
:
10.1149/1.2119787
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:708 / 712
页数:5
相关论文
共 5 条
[1]
JUDGE JS, 1976, P S ETCHING PATTERN, P19
[2]
KERN W, 1976, P S ETCHING PATTERN, P1
[3]
TAPERED WINDOWS IN SIO2 - EFFECT OF NH F-HF DILUTION AND ETCHING TEMPERATURE
PARISI, GI
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PARISI, GI
HASZKO, SE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
HASZKO, SE
ROZGONYI, GA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ROZGONYI, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(06)
: 917
-
921
[4]
ETCH RATE CHARACTERIZATION OF BORON-IMPLANTED THERMALLY GROWN SIO2
SCHWETTM.FN
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
SCHWETTM.FN
DEXTER, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
DEXTER, RJ
COLE, DF
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
COLE, DF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(11)
: 1566
-
1570
[5]
TETRAMESITYLDISILENE, A STABLE COMPOUND CONTAINING A SILICON-SILICON DOUBLE-BOND
WEST, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
WEST, R
FINK, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
FINK, MJ
MICHL, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
MICHL, J
[J].
SCIENCE,
1981,
214
(4527)
: 1343
-
1344
←
1
→
共 5 条
[1]
JUDGE JS, 1976, P S ETCHING PATTERN, P19
[2]
KERN W, 1976, P S ETCHING PATTERN, P1
[3]
TAPERED WINDOWS IN SIO2 - EFFECT OF NH F-HF DILUTION AND ETCHING TEMPERATURE
PARISI, GI
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PARISI, GI
HASZKO, SE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
HASZKO, SE
ROZGONYI, GA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ROZGONYI, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(06)
: 917
-
921
[4]
ETCH RATE CHARACTERIZATION OF BORON-IMPLANTED THERMALLY GROWN SIO2
SCHWETTM.FN
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
SCHWETTM.FN
DEXTER, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
DEXTER, RJ
COLE, DF
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
COLE, DF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(11)
: 1566
-
1570
[5]
TETRAMESITYLDISILENE, A STABLE COMPOUND CONTAINING A SILICON-SILICON DOUBLE-BOND
WEST, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
WEST, R
FINK, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
FINK, MJ
MICHL, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
UNIV UTAH, DEPT CHEM, SALT LAKE CITY, UT 84112 USA
MICHL, J
[J].
SCIENCE,
1981,
214
(4527)
: 1343
-
1344
←
1
→