STUDY ON ADSORPTION BY ELLIPSOMETRY - ADSORPTION OF XE/(0001) GRAPHITE

被引:56
作者
QUENTEL, G [1 ]
RICKARD, JM [1 ]
KERN, R [1 ]
机构
[1] UNIV MARSEILLE 3,CTR ST JEROME,CNRS,CTR RECH MECANISMES CROISS CRISTALLINE,MARSEILLE,FRANCE
关键词
D O I
10.1016/0039-6028(75)90029-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:343 / 359
页数:17
相关论文
共 25 条
[1]  
ALBINET G, 1971, CR ACAD SCI B PHYS, V272, P1155
[2]   MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY [J].
ARCHER, RJ ;
GOBELI, GW .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (02) :343-&
[3]  
ARCHER RJ, 1964, NBS256 MISC PUBL
[4]   ELLIPSOMETRY IN SUB-MONOLAYER REGION [J].
BOOTSMA, GA ;
MEYER, F .
SURFACE SCIENCE, 1969, 14 (01) :52-&
[5]   ADSORPTION OF OXYGEN ON SILICON (111) SURFACES .2. [J].
DORN, R ;
LUTH, H ;
IBACH, H .
SURFACE SCIENCE, 1974, 42 (02) :583-594
[6]  
GREENAWAY DL, 1969, PHYS REV, V178, P3
[7]   A LEED INVESTIGATION OF PHYSISORPTION [J].
LANDER, JJ ;
MORRISON, J .
SURFACE SCIENCE, 1967, 6 (01) :1-&
[8]  
MALLEMANN R, 1944, REV OPT, V23, P20
[9]  
MCCARTNEY JT, 1958, FUEL, V37, P272
[10]   ELLIPSOMETRIC INVESTIGATION OF CHEMISORPTION ON CLEAN SILICON (111) AND (100) SURFACES [J].
MEYER, F ;
BOOTSMA, GA .
SURFACE SCIENCE, 1969, 16 :221-&