READOUT SYSTEM OF THE SILICON MICROSTRIP VERTEX DETECTOR FOR THE KEK B-FACTORY

被引：5

作者：

TANAKA, M ^{[1
]}

IKEDA, H ^{[1
]}

FUJITA, Y ^{[1
]}

OZAKI, H ^{[1
]}

IKEDA, M ^{[1
]}

FUKUNAGA, C ^{[1
]}

机构：

[1] TOKYO METROPOLITAN UNIV,HACHIOJI,TOKYO 19203,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 342卷 / 01期

关键词：

D O I：

10.1016/0168-9002(94)91425-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the KEK B-factory, the readout system of a silicon microstrip vertex detector requires data-sparsification, data-formatting and event-buffering mechanisms. We have developed VLSIs in order to implement the sparsification and formatting mechanisms, and employed Transputers for global control of the readout sequence and to manage the event buffer. In order to prove our architecture, we built a prototype circuit.

引用

页码：169 / 174

页数：6

共 7 条

[1]

FUKUNAGA C, 1993, TMU9350

[2] DESIGN STUDY OF CMOS VLSI FOR KEK B-FACTORY SILICON MICRO-VERTEX DETECTOR [J].

IKEDA, H ;

FUJITA, Y ;

IKEDA, M ;

INABA, S ;

TANAKA, M ;

TSUBOYAMA, T ;

OKUNO, S .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 332 (1-2) :269-276

[3]

IKEDA H, 1992, KEK923 PREPR

[4]

TANAKA M, 1993, KEK9367 PREPR

[5]

TANAKA M, 1993, KEK9348 PREPR

[6]

VERILOG HARDWARE DES

[7]

1989, TRANSPUTER DATA BOOK

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