DIRECT DETERMINATION OF THE STORED ELECTRON-BEAM CURRENT AT THE NBS ELECTRON STORAGE RING, SURF-II

被引:21
作者
SCHAEFER, AR
HUGHEY, LR
FOWLER, JB
机构
关键词
D O I
10.1088/0026-1394/19/4/001
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:131 / 136
页数:6
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共 15 条
[1]   MULTI-DECADE LINEARITY MEASUREMENTS ON SI PHOTO-DIODES [J].
BUDDE, W .
APPLIED OPTICS, 1979, 18 (10) :1555-1558
[2]   CHARACTERISTICS OF SYNCHROTRON LIGHT FROM NBS 180-MEV MACHINE [J].
CODLING, K ;
MADDEN, RP .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) :380-&
[3]   SPECTRAL RESPONSE SELF-CALIBRATION AND INTERPOLATION OF SILICON PHOTO-DIODES [J].
GEIST, J ;
ZALEWSKI, EF ;
SCHAEFER, AR .
APPLIED OPTICS, 1980, 19 (22) :3795-3799
[4]   REDUCED ABSOLUTE UNCERTAINTY IN THE IRRADIANCE OF SURF-II AND INSTRUMENTATION FOR MEASURING LINEARITY OF X-RAY, XUV AND UV DETECTORS [J].
HUGHEY, LR ;
SCHAEFER, AR .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2) :367-370
[5]  
IVANENKO D, 1948, DOKL AKAD NAUK SSSR+, V59, P1551
[6]   SYNCHROTRON RADIATION AS A STANDARD OF SPECTRAL EMISSION [J].
KEY, PJ .
METROLOGIA, 1970, 6 (03) :97-&
[7]  
LIND MA, 1977, NBS950 TECHN NOT
[8]   ABSOLUTE PHOTON-FLUX AND ANGULAR-DISTRIBUTION OF TOKYO SYNCHROTRON RADIATION IN VACUUM ULTRAVIOLET [J].
MASUOKA, T ;
OSHIO, T ;
IWANAGA, R ;
SONODA, H ;
MORIOKA, Y ;
NAKAMURA, M ;
EJIRI, A ;
ONUKI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1976, 15 (08) :1579-1580
[9]   SPECTRAL FLUX MEASUREMENTS OF SYNCHROTRON RADIATION FROM INS MACHINE IN VISIBLE REGION [J].
NISHI, M ;
SUZUKI, M ;
SUGAWARA, F ;
HABU, M ;
NAGASAKA, T ;
ONUKI, H ;
HATTORI, S ;
MORIOKA, Y ;
OSHIO, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (08) :1247-1248
[10]  
SAUNDERS RD, 1977, NBS59413 TECHN NOT