APPARATUS FOR CHARACTERIZING THE VUV AND SOFT-X-RAY OPTICAL-ELEMENTS AT THE PHOTON FACTORY

被引：12

作者：

MITANI, S

NAMIOKA, T

YANAGIHARA, M

YAMASHITA, K

FUJITA, J

MORITA, S

HARADA, T

SASAKI, T

SATO, S

MIYAHARA, T

KOIDE, T

MIKUNI, A

OKAMOTO, W

MAEZAWA, H

机构：

[1] TOHOKU UNIV,SCI MEASUREMENTS RES INST,SENDAI,MIYAGI 980,JAPAN

[2] OSAKA UNIV,FAC SCI,TOYONAKA,OSAKA 560,JAPAN

[3] NAGOYA UNIV,INST PLASMA PHYS,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN

[4] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

[5] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140773

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2216 / 2218

页数：3

共 9 条

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