RECORDING AND DISPLAY SYSTEM FOR HOLOGRAM INTERFEROMETRY WITH LOW RESOLUTION IMAGING DEVICES

被引：15

作者：

BIEDERMANN, K

EK, L

机构：

[1] ROY INST TECHNOL,DEPT PHYS 2,S-100 44 STOCKHOLM,SWEDEN

[2] ROY INST TECHNOL,INST OPTICAL RES,S-100 44 STOCKHOLM,SWEDEN

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1975年 / 8卷 / 07期

关键词：

D O I：

10.1088/0022-3735/8/7/011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：571 / 576

页数：6

共 32 条

[1] SYNTHESIS OF HOLOGRAPHY AND SPECKLE PHOTOGRAPHY TO MEASURE 3-D DISPLACEMENTS
ADAMS, FD
MADDUX, GE
[J]. APPLIED OPTICS, 1974, 13 (02): : 219 - 219
[2] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY
ARCHBOLD, E
BURCH, JM
ENNOS, AE
[J]. OPTICA ACTA, 1970, 17 (12): : 883 - &
[3] VISUAL OBSERVATION OF SURFACE VIBRATION NODAL PATTERNS
ARCHBOLD, E
BURCH, JM
ENNOS, AE
TAYLOR, PA
[J]. NATURE, 1969, 222 (5190) : 263 - &
[4] IN-SITU DOUBLE EXPOSURE INTERFEROMETRY USING PHOTOCONDUCTIVE THERMOPLASTIC FILM
BELLAMY, JC
OSTROWSKY, DB
POINDRON, M
SPITZ, E
[J]. APPLIED OPTICS, 1971, 10 (06) : 1458 - +
[5] COMBINING HYPERSENSITIZATION AND RAPID IN-SITU PROCESSING FOR TIME-AVERAGE OBSERVATION IN REAL-TIME HOLOGRAM INTERFEROMETRY
BIEDERMA.K
MOLIN, NE
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (09): : 669 - &
[6] BIEDERMANN K, 1968, OPTIK, V28, P160
[7] BIEDERMANN K, 1971, ANNUAL M GERMAN SOC
[8] IMAGE PLANE HOLOGRAPHY
BRANDT, GB
[J]. APPLIED OPTICS, 1969, 8 (07): : 1421 - &
[9] LOW-ANGLE HOLOGRAPHIC INTERFEROMETRY USING TRI-X PAN FILM
BROOKS, RE
[J]. APPLIED OPTICS, 1967, 6 (08): : 1418 - &
[10] Butters J. N., 1971, Optics and Laser Technology, V3, P26, DOI 10.1016/S0030-3992(71)80007-5