共 8 条
[1]
THERMAL RESIDUAL-STRESS IN METAL MATRIX COMPOSITE
[J].
ACTA METALLURGICA,
1987, 35 (03)
:651-659
[2]
BOURDILLON AJ, 1985, I PHYS C SER, V78, P161
[3]
LEDBETTER HM, 1986, ADV XRAY ANAL, V29, P71
[4]
A TEM FRESNEL DIFFRACTION-BASED METHOD FOR CHARACTERIZING THIN GRAIN-BOUNDARY AND INTERFACIAL FILMS
[J].
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES,
1986, 54 (05)
:679-702
[5]
SPECIMEN PREPARATION METHODS FOR THE EXAMINATION OF SURFACES AND INTERFACES IN THE TRANSMISSION ELECTRON-MICROSCOPE
[J].
JOURNAL OF MICROSCOPY-OXFORD,
1985, 140
:195-207
[6]
NON-EQUILIBRIUM PHASE DISTRIBUTION IN AN AL-SIC COMPOSITE
[J].
MATERIALS SCIENCE AND ENGINEERING,
1985, 75 (1-2)
:169-177
[8]
WITHERS PJ, 1987, P ICCM 6, V2, P255