SPECIMEN PREPARATION METHODS FOR THE EXAMINATION OF SURFACES AND INTERFACES IN THE TRANSMISSION ELECTRON-MICROSCOPE

被引：102

作者：

NEWCOMB, SB

BOOTHROYD, CB

STOBBS, WM

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02675.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：195 / 207

页数：13

共 18 条

[1] CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
ABRAHAMS, MS
BUIOCCHI, CJ
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (08) : 3315 - 3316
[2] AKAHORI H, 1961, J ELECTRON MICROSC, V10, P175
[3] BARBER DJ, 1970, J MATER SCI, V5, P1, DOI 10.1007/BF02427178
[4] BAXTER CS, 1984, UNPUB ULTRAMICROSCOP
[5] BOOTHROYD CB, 1984, COMMUNICATION
[6] THE PREPARATION OF CROSS-SECTION SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
BRAVMAN, JC
SINCLAIR, R
[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984, 1 (01): : 53 - 61
[7] FIELD S, 1961, ELECTROPLATING
[8] METHOD OF PREPARING TEM FOILS FROM THICK OXIDES AND METAL-OXIDE INTERFACES
MANNING, MI
ROWLANDS, PC
[J]. BRITISH CORROSION JOURNAL, 1980, 15 (04): : 184 - 189
[9] DIRECT SURFACE IMAGING IN SMALL METAL PARTICLES
MARKS, LD
SMITH, DJ
[J]. NATURE, 1983, 303 (5915) : 316 - 317
[10] MCCUNE RC, 1982, J ELECTROCHEM SOC, V127, P737