SPECIMEN PREPARATION METHODS FOR THE EXAMINATION OF SURFACES AND INTERFACES IN THE TRANSMISSION ELECTRON-MICROSCOPE

[11] Newcomb S. B., 1984, Electron Microscopy and Analysis, 1983. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, P315

[12] THE TRANSMISSION ELECTRON-MICROSCOPY OF OXIDE SCALE FORMATION ON FE-NI-CR ALLOYS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY): : 233 - 248

[13] A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE WHITE-ETCHING LAYER ON A RAIL HEAD [J]. MATERIALS SCIENCE AND ENGINEERING, 1984, 66 (02): : 195 - 204

[14] NEWCOMB SB, 1984, METALLURGIST MATERIA, V16, P128

[15] ROUT JE, 1984, RAPIDLY QUENCHED MET, V5

[16] ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : 737 - 743

[17] DEFORMATION-BEHAVIOR OF COPPER IN ULTRAMICROTOMY [J]. ACTA METALLURGICA, 1976, 24 (12): : 1083 - 1093

[18] STOBBS WM, 1984, J MICROSC

[11] Newcomb S. B., 1984, Electron Microscopy and Analysis, 1983. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, P315

[12] THE TRANSMISSION ELECTRON-MICROSCOPY OF OXIDE SCALE FORMATION ON FE-NI-CR ALLOYS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY): : 233 - 248

[13] A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE WHITE-ETCHING LAYER ON A RAIL HEAD [J]. MATERIALS SCIENCE AND ENGINEERING, 1984, 66 (02): : 195 - 204

[14] NEWCOMB SB, 1984, METALLURGIST MATERIA, V16, P128

[15] ROUT JE, 1984, RAPIDLY QUENCHED MET, V5

[16] ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : 737 - 743

[17] DEFORMATION-BEHAVIOR OF COPPER IN ULTRAMICROTOMY [J]. ACTA METALLURGICA, 1976, 24 (12): : 1083 - 1093

[18] STOBBS WM, 1984, J MICROSC