EXPERIMENTAL-OBSERVATION OF MULTIPLE CURRENT-VOLTAGE CURVES AND ZERO-BIAS MEMORY PHENOMENA IN QUANTUM-WELL DIODES WITH N(-)-N(+)-N(-) SPACER LAYERS

被引:12
作者
GULLAPALLI, KK
TSAO, AJ
NEIKIRK, DP
机构
[1] Microelectronics Research Center, Department of Electrical and Computer Engineering, University of Texas at Austin, Austin
关键词
D O I
10.1063/1.109206
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the observation of a new room-temperature storage phenomenon based on quantum interference. Multiple, stable current-voltage curves extending continuously through zero bias have been observed in GaAs/AlAs double barrier quantum well diodes containing n--n+-n- spacer layers. Once placed on a particular branch, the devices retain memory of the branch they lie on, even when held at zero bias for extended periods of time. The devices can be repetitively switched between the different branches of the current-voltage characteristics. The experimental observations are consistent with the multiple self-consistent solutions to the coupled Schrodinger and Poisson equations found for diodes that combine heterostructure tunneling barriers with n--n+-n- spacer layers.
引用
收藏
页码:2856 / 2858
页数:3
相关论文
共 6 条
[1]   IMPORTANCE OF SPACE-CHARGE EFFECTS IN RESONANT TUNNELING DEVICES [J].
CAHAY, M ;
MCLENNAN, M ;
DATTA, S ;
LUNDSTROM, MS .
APPLIED PHYSICS LETTERS, 1987, 50 (10) :612-614
[2]  
GULLAPALLI KK, UNPUB
[3]  
GULLAPALLI KK, 1992, 1992 IEEE INT EL DEV, P479
[4]   ALGAAS/GAAS DOUBLE BARRIER DIODES WITH HIGH PEAK-TO-VALLEY CURRENT RATIO [J].
HUANG, CI ;
PAULUS, MJ ;
BOZADA, CA ;
DUDLEY, SC ;
EVANS, KR ;
STUTZ, CE ;
JONES, RL ;
CHENEY, ME .
APPLIED PHYSICS LETTERS, 1987, 51 (02) :121-123
[5]   HIGH-EFFICIENCY MICROWAVE DIODE OSCILLATORS [J].
JAVALAGI, S ;
REDDY, V ;
GULLAPALLI, K ;
NEIKIRK, D .
ELECTRONICS LETTERS, 1992, 28 (18) :1699-1701
[6]   EFFECTS OF A LOW-DOPED SPACER LAYER IN THE EMITTER OF A RESONANT TUNNELING DIODE [J].
PAULUS, MJ ;
KOENIG, ET ;
JOGAI, B ;
BOZADA, CA ;
HUANG, CI ;
STUTZ, CE ;
EVANS, KR .
SUPERLATTICES AND MICROSTRUCTURES, 1990, 7 (02) :135-137