ANALYSIS OF PLATE AND COLONY PRECIPITATES DECORATING STACKING-FAULTS IN A SINGLE-CRYSTAL SILICON

被引：32

作者：

RYOO, K

DROSD, R

WOOD, W

机构：

[1] BIPOLAR INTEGRATED TECHNOL INC,BEAVERTON,OR 97006

[2] OREGON GRAD CTR,BEAVERTON,OR 97006

来源：

关键词：

D O I：

10.1063/1.340163

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4440 / 4443

页数：4

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