SOFT-X-RAY ANALYSIS SYSTEM FOR REFLECTION, SECONDARY-ELECTRON, AND FLUORESCENCE SPECTROSCOPY

被引：9

作者：

HIRAI, Y

WAKI, I

MOMOSE, A

HAYAKAWA, K

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140774

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2219 / 2222

页数：4

共 24 条

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