CHARACTERIZATION OF DEFECTS IN HYDROGENATED AMORPHOUS-SILICON DEVICES USING CHARGE COLLECTION SCANNING ELECTRON-MICROSCOPY

被引：2

作者：

YACOBI, BG

MATSON, RJ

HERRINGTON, CR

机构：

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1984年 / 13卷 / 06期

关键词：

D O I：

10.1007/BF02655303

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：843 / 854

页数：12

共 10 条

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[9] ELECTRON-BEAM-INDUCED CURRENT MICROCHARACTERIZATION OF FABRICATION DEFECTS IN HYDROGENATED AMORPHOUS-SILICON SOLAR-CELLS [J].

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[10]

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