INTERBAND OPTICAL PROPERTIES OF GRAIN BOUNDARIES IN GERMANIUM - AN AMORPHOUS SYSTEM

被引:9
作者
MCNATT, JL
HANDLER, P
机构
[1] Departments of Physics, Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
[2] Pratt and Whitney Aircraft, Middletown
来源
PHYSICAL REVIEW | 1969年 / 178卷 / 03期
关键词
D O I
10.1103/PhysRev.178.1328
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have measured the interband optical properties of grain boundaries by a spatial-modulation technique which allows direct observation of the differences between the regular lattice and the grain boundary. These results are obtained by periodic motion of the grain boundary in a bicrystal in and out of a narrow light beam and phase-sensitive detection of the difference signal. The grain boundary is found to have an absorption edge which is broadened by the electric fields within the boundary as well as an exponential distribution of states below the direct edge. The results were independent of the tilt axis of the grain boundary (from 4<°to 25<°) and the data are found to be very similar to those observed for amorphous films of germanium. A 6°twist boundary gave identical results. While this paper is concerned with the properties of a planar defect, we believe the method will also prove useful for the study of point defects in crystals. © 1969 The American Physical Society.
引用
收藏
页码:1328 / +
页数:1
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