共 18 条
- [1] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &BISHOP, HERIVIERE, JC
- [2] AUGER-PLASMON-SATELLITE INTENSITIES VERSUS DEPTH - MEANS FOR DETERMINING ADATOM CONCENTRATION PROFILES[J]. PHYSICAL REVIEW B, 1973, 7 (06) : 2305 - 2317FEIBELMAN, PJ
- [3] A NEW METHOD FOR MEASURING ELECTRON IMPACT IONIZATION CROSS SECTIONS OF INNER SHELLS[J]. PHYSICS LETTERS A, 1967, A 25 (03) : 274 - &GLUPE, GMEHLHORN, W
- [4] Glupe G., 1971, J PHYS C SOLID STATE, VC4, P40
- [5] ANGULAR DEPENDENCES IN ELECTRON-EXCITED AUGER EMISSION[J]. SURFACE SCIENCE, 1969, 15 (01) : 77 - &HARRIS, LA
- [6] ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM[J]. SURFACE SCIENCE, 1971, 27 (01) : 88 - +MEYER, FDEKLUIZE.EEBOOTSMA, GA
- [7] MEASUREMENT OF IONIZATION CROSS-SECTION OF L23-SHELL OF CHLORINE USING AUGER-ELECTRON SPECTROSCOPY[J]. PHYSICS LETTERS A, 1973, A 44 (07) : 511 - 512MEYER, FVRAKKING, JJ
- [8] QUANTITATIVE ASPECTS OF AUGER-ELECTRON SPECTROSCOPY[J]. SURFACE SCIENCE, 1972, 33 (02) : 271 - &MEYER, FVRAKKING, JJ
- [9] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 160 - &PALMBERG, PW
- [10] OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMS[J]. APPLIED PHYSICS LETTERS, 1968, 13 (05) : 183 - &PALMBERG, PW