SURFACE CONTAMINATION OF ACTIVE ELECTRODES IN PLASMAS - DISTORTION OF CONVENTIONAL LANGMUIR PROBE MEASUREMENTS

被引：55

作者：

SZUSZCZEWICZ, EP ^{[1
]}

HOLMES, JC ^{[1
]}

机构：

[1] USN,RES LAB,EO HULBURT CTR SPACE RES,WASHINGTON,DC 20375

来源：

关键词：

D O I：

10.1063/1.321572

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5134 / 5139

页数：6

共 11 条

[1] PULSED LANGMUIR PROBE MEASUREMENTS IN A HELIUM AFTERGLOW PLASMA [J].

BLUE, E ;

STANKO, JE .

[2]

Chen F F, 1965, PLASMA DIAGNOSTIC TE, P113

[3]

GAINS GL, 1966, SCIENTIFIC F VACUUM, P376

[4]

HIROA K, 1972, J GEOMAGN GEOELECTR, V24, P415

[5] VERSATILE PLASMA PROBE [J].

HOLMES, JC ;

SZUSZCZEWICZ, EP .

[6]

MCDANIEL EW, 1964, COLLISION PHENOMENA, pCH13

[7]

MCDONALD BE, 1975, EFFECT IONOSPHERE SP

[8]

SZUSZCZEWICZ EP, 1975, EFFECT IONOSPHERE SP

[9]

WAYMOUTH JF, 1966, J APPL PHYS, V37, P4992

[10] RELIABILITY OF PROBE MEASUREMENTS IN HOT CATHODE GAS DIODES [J].

WEHNER, G ;

MEDICUS, G .