XPS INTENSITIES AND BINDING-ENERGY SHIFTS AS METAL DISPERSION PARAMETERS IN NI/SIO2 CATALYSTS

被引：42

作者：

GONZALEZELIPE, AR ^{[1
]}

MUNUERA, G ^{[1
]}

ESPINOS, JP ^{[1
]}

机构：

[1] UNIV SEVILLA,DPTO QUIM INORGAN,E-41071 SEVILLE,SPAIN

来源：

SURFACE AND INTERFACE ANALYSIS | 1990年 / 16卷 / 1-12期

关键词：

Nickel and Alloys - Silica - Spectroscopy; Photoelectron;

D O I：

10.1002/sia.740160179

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A set of Ni/SiO2 catalysts with metal loadings between 1 and 8% by weight has been prepared by several methods. Metal dispersions have been determined by H2 chemisorption and x‐ray line broadening analysis, giving metal particle sizes from ∼30 to 250 Å. XPS analysis of the samples has been recorded after reduction in situ and the data correlated with the metal loading and metal dispersion. When comparing the Ni 2p intensities, a good relationship has been obtained with metal surface concentration, showing the existence of two well‐defined set of catalysts with particles of quite different sizes. However, a single linear relationship is obtained for all the samples when the Ni 2p binding energies are plotted against the metal dispersion calculated from H2 chemisorption. The origin of the binding energy shift and its relation with metal dispersion is discussed. Copyright © 1990 John Wiley & Sons Ltd.

引用

页码：375 / 379

页数：5

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