PARTICLE-SIZE INFORMATION FROM DISPERSED PHASE PHOTOEMISSION INTENSITY RATIOS

被引：39

作者：

DAVIS, SM

机构：

来源：

JOURNAL OF CATALYSIS | 1989年 / 117卷 / 02期

关键词：

D O I：

10.1016/0021-9517(89)90353-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

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页码：432 / 446

页数：15

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[1] ANGEVINE PJ, 1976, 6 P INT C CAT LOND
[2] DAVIS SM, 1985, B SOC CHIM FR, P271
[3] DAVIS SM, IN PRESS J CATAL
[4] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY
FADLEY, CS
BAIRD, RJ
SIEKHAUS, W
NOVAKOV, T
BERGSTROM, SA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) : 93 - 137
[5] APPLICATION OF XPS TO THE DETERMINATION OF THE SIZE OF SUPPORTED PARTICLES IN A CATALYST-MODEL DEVELOPMENT AND ITS APPLICATION TO DESCRIBE THE SINTERING BEHAVIOR OF A SILICA-SUPPORTED PT FILM
FUNG, SC
[J]. JOURNAL OF CATALYSIS, 1979, 58 (03) : 454 - 469
[6] KERKHOF FPJ, 1979, J PHYS CHEM-US, V83, P1012
[7] PROBING DEPTH IN PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY
LINDAU, I
SPICER, WE
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (05) : 409 - 413
[8] ATTENUATION LENGTHS OF LOW-ENERGY ELECTRONS IN SOLIDS
POWELL, CJ
[J]. SURFACE SCIENCE, 1974, 44 (01) : 29 - 46
[9] THE ENERGY-DEPENDENCE OF ELECTRON ATTENUATION LENGTHS
POWELL, CJ
[J]. SURFACE AND INTERFACE ANALYSIS, 1985, 7 (06) : 256 - 262
[10] Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103