DIFFRACTION SCATTERING AT ANGLES FAR FROM THE BRAGG ANGLE AND THE STRUCTURE OF THIN SUBSURFACE LAYERS

被引：42

作者：

AFANASEV, AM ^{[1
]}

ALEKSANDROV, PA ^{[1
]}

IMAMOV, RM ^{[1
]}

LOMOV, AA ^{[1
]}

ZAVYALOVA, AA ^{[1
]}

机构：

[1] ACAD SCI USSR,INST CRYSTALLOG,MOSCOW 117333,USSR

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷 / JUL期

关键词：

D O I：

10.1107/S0108767384000763

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：352 / 355

页数：4

共 4 条

[1] Afanas'ev A. M., 1981, Soviet Physics - Crystallography, V26, P13
[2] X-RAY-DIFFRACTION IN A PERFECT CRYSTAL WITH DISTURBED SURFACE-LAYER
AFANASEV, AM
KOVALCHUK, MV
KOVEV, EK
KOHN, VG
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 42 (01): : 415 - 422
[3] STRUCTURE OF THIN OXIDE FILMS FORMED ON NICKEL CRYSTALS
CATHCART, JV
PETERSEN, GF
SPARKS, CJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (05) : 664 - &
[4] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER
IIDA, A
KOHRA, K
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02): : 533 - 542