APPLICATIONS OF ENERGY ANALYSIS IN A TRANSMISSION ELECTRON-MICROSCOPE

被引：7

作者：

ROSSOUW, CJ ^{[1
]}

EGERTON, RF ^{[1
]}

WHELAN, MJ ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD,ENGLAND

来源：

VACUUM | 1976年 / 26卷 / 10-1期

关键词：

D O I：

10.1016/0042-207X(76)90213-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：427 / 432

页数：6

共 26 条

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BOERSCH, H ;

GEIGER, J ;

BOHG, A .

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[3]

CASTAING R, 1962, CR HEBD ACAD SCI, V255, P76

[4]

CAUCHOIS Y, 1949, PHILOS MAG, V40, P1260

[5] DIRECT MEASUREMENT OF CONTAMINATION AND ETCHING RATES IN AN ELECTRON-BEAM [J].

EGERTON, RF ;

ROSSOUW, CJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (04) :659-663

[6] ELECTRON-ENERGY LOSS SPECTRA OF DIAMOND, GRAPHITE AND AMORPHOUS CARBON [J].

EGERTON, RF ;

WHELAN, MJ .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (03) :232-236

[7] INELASTIC-SCATTERING OF 80 KEV ELECTRONS IN AMORPHOUS CARBON [J].

EGERTON, RF .

PHILOSOPHICAL MAGAZINE, 1975, 31 (01) :199-215

[8]

EGERTON RF, 1976, DEV ELECTRON MICROSC, P137

[9]

EGERTON RF, 1976, DEV ELECTRON MICROSC, P35

[10]

EGERTON RF, 1976, DEV ELECTRON MICROSC, P129

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