STUDIES OF THE COMPENSATION MECHANISM IN CDTE GROWN FROM THE VAPOR-PHASE

被引:28
作者
FIEDERLE, M [1 ]
EBLING, D [1 ]
EICHE, C [1 ]
HUG, P [1 ]
JOERGER, W [1 ]
LAASCH, M [1 ]
SCHWARZ, R [1 ]
SALK, M [1 ]
BENZ, KW [1 ]
机构
[1] UNIV FREIBURG,INST KRISTALLOG,D-79104 FREIBURG,GERMANY
关键词
D O I
10.1016/0022-0248(94)00473-0
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Semi-insulating titanium and vanadium doped cadmium telluride crystals were grown from the vapour phase. We show results of the electrical characterisation obtained by Hall measurements, photoinduced current transient spectroscopy (PICTS), admittance spectroscopy and time-of-flight measurements. The crystals with a resistivity of about 10(9) Omega.cm showed a deep level, which was identified for CdTe:V at - 0.77 eV and a similar value at - 0.66 eV for CdTe:Ti, both with reference to the conduction band. The mu tau products are almost the same for both materials in the range of 10(-5) cm(2)/V. A compensation model, which was developed for semi-insulating GaAs, is adapted to semi-insulating vanadium- and titanium-doped cadmium telluride. We show that the data from the compensation model correspond to the measured properties.
引用
收藏
页码:142 / 147
页数:6
相关论文
共 17 条
[1]   ON THE CLOSE COMPENSATION MECHANISM IN CDTE(LI, CL) CRYSTALS [J].
AGRINSKAYA, NV ;
MATVEEV, OA .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 283 (02) :263-264
[2]  
DELAYE P, 1994, MRS BULL, P39
[3]   INVESTIGATION OF CDTE-CL GROWN FROM THE VAPOR-PHASE UNDER MICROGRAVITY CONDITIONS WITH TIME-DEPENDENT CHARGE MEASUREMENTS AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY [J].
EICHE, C ;
JOERGER, W ;
FIEDERLE, M ;
EBLING, D ;
SCHWARZ, R ;
BENZ, KW .
JOURNAL OF CRYSTAL GROWTH, 1995, 146 (1-4) :98-103
[4]   ANALYSIS OF PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS) DATA BY A REGULARIZATION METHOD [J].
EICHE, C ;
MAIER, D ;
SCHNEIDER, M ;
SINERIUS, D ;
WEESE, J ;
BENZ, KW ;
HONERKAMP, J .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1992, 4 (28) :6131-6140
[5]   COMPARISON OF CDTE, CD0.9ZN0.1TE AND CDTE0.9SE0.1 CRYSTALS - APPLICATION FOR GAMMA-RAY AND X-RAY-DETECTORS [J].
FIEDERLE, M ;
EBLING, D ;
EICHE, C ;
HOFMANN, DM ;
SALK, M ;
STADLER, W ;
BENZ, KW ;
MEYER, BK .
JOURNAL OF CRYSTAL GROWTH, 1994, 138 (1-4) :529-533
[6]  
JOHNSON EJ, 1982, J APPL PHYS, V54, P204
[7]   GROWTH, SPECTROSCOPIC AND PHOTOREFRACTIVE INVESTIGATION OF VANADIUM-DOPED CADMIUM TELLURIDE [J].
LAUNAY, JC ;
MAZOYER, V ;
TAPIERO, M ;
ZIELINGER, JP ;
GUELLIL, Z ;
DELAYE, P ;
ROOSEN, G .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1992, 55 (01) :33-40
[8]  
MAIER D, IN PRESS
[9]  
Martini M., 1972, APPL SOLID STATE SCI, V3, P181
[10]  
MEYER BK, 1993, P MATER RES SOC, V302, P189