TRANSPORT CHARACTERISTICS OF POLYCRYSTALLINE-SILICON WIRE INFLUENCED BY SINGLE-ELECTRON CHARGING AT ROOM-TEMPERATURE

被引:54
作者
YANO, K
ISHII, T
HASHIMOTO, T
KOBAYASHI, T
MURAI, F
SEKI, K
机构
[1] Central Research Laboratory, Hitachi Ltd., Kokubunji
关键词
D O I
10.1063/1.115457
中图分类号
O59 [应用物理学];
学科分类号
摘要
Conductance of ultrathin polycrystalline silicon wire was measured and periodic plateaus, which provide evidence of the Coulomb staircase at room temperature, are observed. This shows that single-electron charging effects are important to transport in a semiconductor system at room temperature. The very small (similar to 10-nm diam) silicon-grain structure is presumably playing a key role in creating the observed effects. From the temperature dependence, the electron transport is clearly dominated by the thermal emission, whose activation energy is more than 400 meV. This reveals that the treatment beyond well-established single-electron tunneling, including thermal-emission transfer, is essential to understand such high-temperature charging effects in semiconductor systems. (C) 1995 American Institute of Physics.
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页码:828 / 830
页数:3
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共 20 条
  • [1] THE CHARGE-EFFECT TRANSISTOR
    AMMAN, M
    MULLEN, K
    BENJACOB, E
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) : 339 - 346
  • [2] SINGLE-ELECTRON CAPACITANCE SPECTROSCOPY OF DISCRETE QUANTUM LEVELS
    ASHOORI, RC
    STORMER, HL
    WEINER, JS
    PFEIFFER, LN
    PEARTON, SJ
    BALDWIN, KW
    WEST, KW
    [J]. PHYSICAL REVIEW LETTERS, 1992, 68 (20) : 3088 - 3091
  • [3] Averin D. V., 1991, QUANTUM EFFECTS SMAL
  • [4] THEORY OF SINGLE-ELECTRON CHARGING OF QUANTUM-WELLS AND DOTS
    AVERIN, DV
    KOROTKOV, AN
    LIKHAREV, KK
    [J]. PHYSICAL REVIEW B, 1991, 44 (12): : 6199 - 6211
  • [5] SINGLE-ELECTRON CHARGING EFFECTS IN INSULATING WIRES
    CHANDRASEKHAR, V
    OVADYAHU, Z
    WEBB, RA
    [J]. PHYSICAL REVIEW LETTERS, 1991, 67 (20) : 2862 - 2865
  • [6] OBSERVATION OF SINGLE-ELECTRON CHARGING EFFECTS IN SMALL TUNNEL-JUNCTIONS
    FULTON, TA
    DOLAN, GJ
    [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (01) : 109 - 112
  • [7] FREQUENCY-LOCKED TURNSTILE DEVICE FOR SINGLE ELECTRONS
    GEERLIGS, LJ
    ANDEREGG, VF
    HOLWEG, PAM
    MOOIJ, JE
    POTHIER, H
    ESTEVE, D
    URBINA, C
    DEVORET, MH
    [J]. PHYSICAL REVIEW LETTERS, 1990, 64 (22) : 2691 - 2694
  • [8] SUPERCONDUCTIVITY OF SMALL TIN PARTICLES MEASURED BY TUNNELING
    GIAEVER, I
    ZELLER, HR
    [J]. PHYSICAL REVIEW LETTERS, 1968, 20 (26) : 1504 - &
  • [9] Grabert H., 1991, NATO ASI SERIES B
  • [10] SINGLE-ELECTRON THERMIONIC-EMISSION OSCILLATIONS IN P-N MICROJUNCTIONS
    IMAMOGLU, A
    YAMAMOTO, Y
    SOLOMON, P
    [J]. PHYSICAL REVIEW B, 1992, 46 (15) : 9555 - 9563