THE YIELD STRESS OF POLYCRYSTALLINE THIN-FILMS

被引：173

作者：

THOMPSON, CV

机构：

[1] Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts

来源：

JOURNAL OF MATERIALS RESEARCH | 1993年 / 8卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1557/JMR.1993.0237

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.

引用

页码：237 / 238

页数：2

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