STRUCTURAL, MORPHOLOGICAL, AND OPTICAL-RECORDING CHARACTERIZATION OF SELENIUM FILMS

被引：8

作者：

SINGH, A

LI, S

LESSARD, RA

机构：

来源：

OPTICAL ENGINEERING | 1987年 / 26卷 / 09期

关键词：

D O I：

10.1117/12.7974175

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：944 / 948

页数：5

相关论文

共 13 条

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SINGH, A ;

LESSARD, RA ;

SAMSON, M .

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[12] STRUCTURAL STUDIES OF CADMIUM FILMS GROWN BY HOT WALL EPITAXY (HWE) TECHNIQUE [J].

SINGH, A .

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[13] SUBSTRATE EFFECTS ON CRYSTALLIZATION KINETICS OF AMORPHOUS SELENIUM THIN-FILMS [J].

THORNBURG, DD .

THIN SOLID FILMS, 1976, 37 (02) :215-222