OPTICAL RECOVERY OF PHOTOQUENCHING AT THE MIDGAP ELECTRON TRAPS (EL2 FAMILY) IN GAAS

被引:28
作者
MOCHIZUKI, Y
IKOMA, T
机构
[1] Univ of Tokyo, Research Cent for, Function-Oriented Electronics,, Tokyo, Jpn, Univ of Tokyo, Research Cent for Function-Oriented Electronics, Tokyo, Jpn
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1985年 / 24卷 / 11期
关键词
D O I
10.1143/JJAP.24.L895
中图分类号
O59 [应用物理学];
学科分类号
摘要
Partial optical recovery from the metastable state to the normal state was observed at the EL2 centers in liquid encapsulated Czochralski GaAs from photocapacitance measurements. It was found that the optical recovery spectrum has a peak at 0. 855 ev with FWHM of 0. 13 ev and that the recovery process has a strong non-exponentiality. Photoquenching transients at the optically recovered levels show that they are not regarded as a single level. The transition scheme between these states is found to be inconsistent within a simple configuration coordinate diagram model but is more likely to be due to various defect reactions in sizable defects. The result supports an arsenic cluster model for the origin of the EL2 family which we have already proposed.
引用
收藏
页码:L895 / L898
页数:4
相关论文
共 12 条
[1]  
IKOMA T, 1984, I PHYS C SER, V74, P65
[2]  
IKOMA T, UNPUB JPN J APPL PHY
[3]   CHARGE-STATE-CONTROLLED STRUCTURAL RELAXATION OF THE EL2 CENTER IN GAAS [J].
LEVINSON, M .
PHYSICAL REVIEW B, 1983, 28 (06) :3660-3662
[4]  
MITTONEAU A, 1979, SOLID STATE COMMUN, V30, P157
[5]   A NEW SLOW-RELAXATION PHENOMENON IN SEMI-INSULATING GAAS [J].
NOJIMA, S .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (02) :620-622
[6]   FATIGUE AND RECOVERY EFFECTS OF THE 0.65-EV EMISSION BAND IN GAAS [J].
TAJIMA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (09) :L690-L693
[7]   VARIATION OF THE MIDGAP ELECTRON TRAPS (EL2) IN LIQUID ENCAPSULATED CZOCHRALSKI GAAS [J].
TANIGUCHI, M ;
IKOMA, T .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6448-6451
[8]   SPECTRAL DISTRIBUTIONS OF PHOTOQUENCHING RATE AND MULTIMETASTABLE STATES FOR MIDGAP ELECTRON TRAPS (EL2 FAMILY) IN GAAS [J].
TANIGUCHI, M ;
IKOMA, T .
APPLIED PHYSICS LETTERS, 1984, 45 (01) :69-71
[9]  
Taniguchi M., 1984, Semi-Insulating III-V materials, P231
[10]  
TANIGUCHI M, 1982, SEMIINSULATING 3 5 M, P283